图像仅供参考
请参阅产品规格
-
商品编号:
XS3A4052PWJ
-
简述:
Low-ohmic dual-pole quad-throw analog switch
-
描述:
The XS3A4052 is a low-ohmic dual-pole quad-throw analog switch (DP4T), suitable for use as an analog or digital multiplexer/demultiplexer. Each switch features four independent inputs/outputs (nY0, nY1, nY2 and nY3) and a common input/output (nZ). A digital enable input (E) and two digital select inputs (S0 and S1) are common to both switches. When E is HIGH, the switches are turned off.
Schmitt trigger action at the digital inputs makes the circuit tolerant to slower input rise and fall times. Low threshold digital inputs allows this device to be driven by 1.8 V logic levels in 3.3 V applications without significant increase in supply current ICC. This makes it possible for the XS3A4052 to switch 4.3 V signals with a 1.8 V digital controller, eliminating the need for logic level translation. The XS3A4052 allows signals with amplitude up to VCC to be transmitted from nZ to nYn or from nYn to nZ. Its low ON resistance (0.5 Ω) and flatness (0.13 Ω) ensures minimal attenuation and distortion of transmitted signals.
- 数据手册:
特性
Wide supply voltage range from 1.4 V to 4.3 V
Very low ON resistance (peak):
1.6 Ω (typical) at VCC = 1.4 V
1.0 Ω (typical) at VCC = 1.65 V
0.55 Ω (typical) at VCC = 2.3 V
0.50 Ω (typical) at VCC = 2.7 V
0.50 Ω (typical) at VCC = 4.3 V
Break-before-make switching
High noise immunity
ESD protection:
HBM ANSI/ESDA/JEDEC JS-001 exceeds 6000 V
CDM ANSI/ESDA/JEDEC JS-002 exceeds 1000 V
IEC61000-4-2 contact discharge exceeds 8000 V for switch ports
CMOS low-power consumption
Latch-up performance exceeds 100 mA per JESD78 Class II Level A
Low-switching threshold levels
Control input accepts voltages above supply voltage
Very low supply current, even when input is below VCC
High current handling capability (350 mA continuous current under 3.3 V supply)
Specified from -40 °C to +85 °C and from -40 °C to +125 °C
目标应用
Appliances
Communication Systems
Medical Equipment
Analog Sensor Monitoring
Audio Routing/Switching
Test and Measurement