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商品编号:
74HCT574PW-Q100,11
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简述:
Q100; 74HCT574-Q100 - Octal D-type flip-flop; positive edge-trigger; 3-state
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描述:
The 74HC574-Q100; 74HCT574-Q100 is an 8-bit positive-edge triggered D-type flip-flop with 3-state outputs. The device features a clock (CP) and output enable (OE) inputs. The flip-flops will store the state of their individual D-inputs that meet the set-up and hold time requirements on the LOW-to-HIGH clock (CP) transition. A HIGH on OE causes the outputs to assume a high-impedance OFF-state. Operation of the OE input does not affect the state of the flip-flops. Inputs include clamp diodes. This enables the use of current limiting resistors to interface inputs to voltages in excess of VCC.
This product has been qualified to the Automotive Electronics Council (AEC) standard Q100 (Grade 1) and is suitable for use in automotive applications.
- 数据手册:
特性
Automotive product qualification in accordance with AEC-Q100 (Grade 1)
Specified from -40 °C to +85 °C and from -40 °C to +125 °C
Wide supply voltage range from 2.0 V to 6.0 V
CMOS low power dissipation
High noise immunity
Latch-up performance exceeds 100 mA per JESD 78 Class II Level B
Complies with JEDEC standards:
JESD8C (2.7 V to 3.6 V)
JESD7A (2.0 V to 6.0 V)
Input levels:
For 74HC574-Q100: CMOS level
For 74HCT574-Q100: TTL level
3-state non-inverting outputs for bus oriented applications
8-bit positive, edge-triggered register
Common 3-state output enable input
ESD protection:
MIL-STD-883, method 3015 exceeds 2 kV
HBM JESD22-A114F exceeds 2 kV
MM JESD22-A115-A exceeds 200 V (C = 200 pF, R = 0 Ω)
DHVQFN package with Side-Wettable Flanks enabling Automatic Optical Inspection (AOI) of solder joints
